DSpace at KIST: AES Analysis of Au, Au/Cr, Au/Ni/Cr and Au/Pd/Cr Thin Films by the Change of Substrate Temperature and Annealing Temperature

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DC Field	Value	Language
dc.contributor.author	정형진	-
dc.contributor.author	유광수	-
dc.date.accessioned	2024-01-21T22:43:42Z	-
dc.date.available	2024-01-21T22:43:42Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1993-01	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/146229	-
dc.title	AES Analysis of Au, Au/Cr, Au/Ni/Cr and Au/Pd/Cr Thin Films by the Change of Substrate Temperature and Annealing Temperature	-
dc.title.alternative	기판온도와 열처리온도의 변화에 따른 Au/Cr, Au/Ni/Cr 및 Au/Pd/Cr 다층박막의 AES 분석 .	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	분석과학과 기술 ( 한국분석과학회지 ), v.v. 6, no.no. 2, pp.217 - 223	-
dc.citation.title	분석과학과 기술 ( 한국분석과학회지 )	-
dc.citation.volume	v. 6	-
dc.citation.number	no. 2	-
dc.citation.startPage	217	-
dc.citation.endPage	223	-

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