Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | LEE, JM | - |
dc.contributor.author | KIM, SY | - |
dc.contributor.author | RA, JW | - |
dc.date.accessioned | 2024-01-21T23:04:19Z | - |
dc.date.available | 2024-01-21T23:04:19Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 1992-12 | - |
dc.identifier.issn | 0950-107X | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/146351 | - |
dc.description.abstract | A further study is made of the reconstruction of permittivity profile by using the spectral inverse scattering scheme with the moment-method procedures. Based on earlier works, the reconstructed profiles have been affected by large errors even with a negligible random noise of the measured field. One of the intuitive approaches to reduce these errors has been implemented successfully by employing a polynomial basis function to the induced field on each enlarged cell in conjunction with a suitable weighting function. Another method is presented which adopts a low-pass filter to the spatial-Fourier transform of the equivalent source distribution induced in a dielectric object. The accuracy and validity of the spectral filtering are assured by a number of numerical simulations for a simple test geometry. | - |
dc.language | English | - |
dc.publisher | IEE-INST ELEC ENG | - |
dc.title | FILTERING EFFECTS ON PERMITTIVITY PROFILES RECONSTRUCTED BY A SPECTRAL INVERSE SCATTERING TECHNIQUE | - |
dc.type | Article | - |
dc.identifier.doi | 10.1049/ip-h-2.1992.0091 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | IEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION, v.139, no.6, pp.507 - 512 | - |
dc.citation.title | IEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION | - |
dc.citation.volume | 139 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 507 | - |
dc.citation.endPage | 512 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | A1992KD33700006 | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalResearchArea | Optics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | MULTIPLE SOURCE | - |
dc.subject.keywordPlus | MOMENT METHOD | - |
dc.subject.keywordAuthor | INVERSE SCATTERING | - |
dc.subject.keywordAuthor | NUMERICAL ANALYSIS | - |
dc.subject.keywordAuthor | DIELECTRICS | - |
dc.subject.keywordAuthor | ELECTROMAGNETIC SCATTERING | - |
dc.subject.keywordAuthor | RECONSTRUCTION | - |
dc.subject.keywordAuthor | MICROWAVE IMAGING | - |
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