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dc.contributor.authorLEE, JM-
dc.contributor.authorKIM, SY-
dc.contributor.authorRA, JW-
dc.date.accessioned2024-01-21T23:04:19Z-
dc.date.available2024-01-21T23:04:19Z-
dc.date.created2021-09-02-
dc.date.issued1992-12-
dc.identifier.issn0950-107X-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/146351-
dc.description.abstractA further study is made of the reconstruction of permittivity profile by using the spectral inverse scattering scheme with the moment-method procedures. Based on earlier works, the reconstructed profiles have been affected by large errors even with a negligible random noise of the measured field. One of the intuitive approaches to reduce these errors has been implemented successfully by employing a polynomial basis function to the induced field on each enlarged cell in conjunction with a suitable weighting function. Another method is presented which adopts a low-pass filter to the spatial-Fourier transform of the equivalent source distribution induced in a dielectric object. The accuracy and validity of the spectral filtering are assured by a number of numerical simulations for a simple test geometry.-
dc.languageEnglish-
dc.publisherIEE-INST ELEC ENG-
dc.titleFILTERING EFFECTS ON PERMITTIVITY PROFILES RECONSTRUCTED BY A SPECTRAL INVERSE SCATTERING TECHNIQUE-
dc.typeArticle-
dc.identifier.doi10.1049/ip-h-2.1992.0091-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION, v.139, no.6, pp.507 - 512-
dc.citation.titleIEE PROCEEDINGS-H MICROWAVES ANTENNAS AND PROPAGATION-
dc.citation.volume139-
dc.citation.number6-
dc.citation.startPage507-
dc.citation.endPage512-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1992KD33700006-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalResearchAreaOptics-
dc.type.docTypeArticle-
dc.subject.keywordPlusMULTIPLE SOURCE-
dc.subject.keywordPlusMOMENT METHOD-
dc.subject.keywordAuthorINVERSE SCATTERING-
dc.subject.keywordAuthorNUMERICAL ANALYSIS-
dc.subject.keywordAuthorDIELECTRICS-
dc.subject.keywordAuthorELECTROMAGNETIC SCATTERING-
dc.subject.keywordAuthorRECONSTRUCTION-
dc.subject.keywordAuthorMICROWAVE IMAGING-
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