DSpace at KIST: Relationship Between Voltage-time Characteristics and Microstructures of Tantalum Oxide Thin Films Prepared by Anodic Oxidation

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DC Field	Value	Language
dc.contributor.author	정형진	-
dc.contributor.author	이동헌	-
dc.contributor.author	윤상옥	-
dc.date.accessioned	2024-01-22T00:08:04Z	-
dc.date.available	2024-01-22T00:08:04Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1991-01	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/146964	-
dc.title	Relationship Between Voltage-time Characteristics and Microstructures of Tantalum Oxide Thin Films Prepared by Anodic Oxidation	-
dc.title.alternative	양극 산화법으로 제조된 Tantalum Oxide 박막의 전압 - 시간 특성과 미세구조와의 연관성 .	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	한국요업학회지, v.v. 28, no.no. 6, pp.443 - 450	-
dc.citation.title	한국요업학회지	-
dc.citation.volume	v. 28	-
dc.citation.number	no. 6	-
dc.citation.startPage	443	-
dc.citation.endPage	450	-

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