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dc.contributor.authorKIM, EK-
dc.contributor.authorCHO, HY-
dc.contributor.authorMIN, SK-
dc.contributor.authorCHOH, SH-
dc.contributor.authorNAMBA, S-
dc.date.accessioned2024-01-22T00:32:02Z-
dc.date.available2024-01-22T00:32:02Z-
dc.date.created2021-09-05-
dc.date.issued1990-02-01-
dc.identifier.issn0021-8979-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/147141-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.titleEFFECTS OF LEAKAGE CURRENT ON ISOTHERMAL CAPACITANCE TRANSIENT SPECTROSCOPY SIGNALS FOR MIDGAP LEVELS IN GAAS-
dc.typeArticle-
dc.identifier.doi10.1063/1.345692-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.67, no.3, pp.1380 - 1383-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume67-
dc.citation.number3-
dc.citation.startPage1380-
dc.citation.endPage1383-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1990CL92000037-
dc.identifier.scopusid2-s2.0-0011111299-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordAuthorleakage current-
dc.subject.keywordAuthormidgap levels-
dc.subject.keywordAuthorGaAs-
dc.subject.keywordAuthorisothermal capacitance transient spectroscopy-
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