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dc.contributor.author김은규-
dc.contributor.author조훈영-
dc.contributor.author윤주훈-
dc.contributor.author민석기-
dc.contributor.author정영래-
dc.contributor.author이완호-
dc.date.accessioned2024-01-22T00:32:31Z-
dc.date.available2024-01-22T00:32:31Z-
dc.date.created2022-01-10-
dc.date.issued1990-02-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/147148-
dc.title열처리된 InP-MIS 구조 시료에 대한 깊은 준위 결함상태 .-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitation새물리, v.v. 30, no.no. 1, pp.35 - 40-
dc.citation.title새물리-
dc.citation.volumev. 30-
dc.citation.numberno. 1-
dc.citation.startPage35-
dc.citation.endPage40-
dc.subject.keywordAuthorInP-MIS structure-
dc.subject.keywordAuthorthermal annealing-
dc.subject.keywordAuthordeep level trap-
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