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dc.contributor.authorLEE, SY-
dc.contributor.authorKIM, YH-
dc.contributor.authorPARK, JH-
dc.contributor.authorCHOI, SS-
dc.date.accessioned2024-01-22T00:32:45Z-
dc.date.available2024-01-22T00:32:45Z-
dc.date.created2022-01-11-
dc.date.issued1990-01-22-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/147152-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.titleEFFECT OF THE CRITICAL CURRENT CRITERIA ON THE IC VS T RELATION NEAR TC IN POLYCRYSTALLINE Y-BA-CU-O THIN-FILMS-
dc.typeArticle-
dc.identifier.doi10.1063/1.103294-
dc.description.journalClass1-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.56, no.4, pp.403 - 405-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume56-
dc.citation.number4-
dc.citation.startPage403-
dc.citation.endPage405-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1990CJ67900034-
dc.identifier.scopusid2-s2.0-5644228287-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
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