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dc.contributor.authorCHO, HY-
dc.contributor.authorKIM, EK-
dc.contributor.authorMIN, SK-
dc.date.accessioned2024-01-22T00:44:50Z-
dc.date.available2024-01-22T00:44:50Z-
dc.date.created2022-01-10-
dc.date.issued1989-05-15-
dc.identifier.issn0163-1829-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/147349-
dc.languageEnglish-
dc.publisherAMERICAN PHYSICAL SOC-
dc.titlePHOTOQUENCHING EFFECT AND THERMAL RECOVERY PROCESS FOR MIDGAP LEVELS IN GAAS - AN EL2 FAMILY IN GAAS-
dc.typeArticle-
dc.identifier.doi10.1103/PhysRevB.39.10376-
dc.description.journalClass1-
dc.identifier.bibliographicCitationPHYSICAL REVIEW B, v.39, no.14, pp.10376 - 10379-
dc.citation.titlePHYSICAL REVIEW B-
dc.citation.volume39-
dc.citation.number14-
dc.citation.startPage10376-
dc.citation.endPage10379-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1989U545500077-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeNote-
dc.subject.keywordAuthorphotoquenching-
dc.subject.keywordAuthormidgap level-
dc.subject.keywordAuthorEL2 family-
dc.subject.keywordAuthorGaAs-
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