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dc.contributor.author최현철-
dc.contributor.author나정웅-
dc.contributor.author김세윤-
dc.date.accessioned2024-01-22T01:05:56Z-
dc.date.available2024-01-22T01:05:56Z-
dc.date.created2022-01-10-
dc.date.issued1989-01-
dc.identifier.issn0895-2477-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/147483-
dc.languageEnglish-
dc.publisherJohn Wiley & Sons Inc.-
dc.titleRegularization of permittivity profiles reconstructed by a spectral inverse scattering scheme.-
dc.typeArticle-
dc.identifier.doi10.1002/mop.4650020111-
dc.description.journalClass1-
dc.identifier.bibliographicCitationMicrowave and Optical Technology Letters, v.2, no.1, pp.26 - 29-
dc.citation.titleMicrowave and Optical Technology Letters-
dc.citation.volume2-
dc.citation.number1-
dc.citation.startPage26-
dc.citation.endPage29-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1989T267400010-
dc.subject.keywordAuthorinverse scattering-
dc.subject.keywordAuthordielectrics-
dc.subject.keywordAuthorsignal processing-
dc.subject.keywordAuthormoment method-
dc.subject.keywordAuthorregularization method-
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