Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 강광남 | - |
| dc.date.accessioned | 2024-01-22T02:06:50Z | - |
| dc.date.available | 2024-01-22T02:06:50Z | - |
| dc.date.created | 2022-01-10 | - |
| dc.date.issued | 1984-01 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/148050 | - |
| dc.title | Vieillissement des transistors MOS submicroniques apres contrainte electrique revue. | - |
| dc.type | Article | - |
| dc.description.journalClass | 3 | - |
| dc.identifier.bibliographicCitation | Phys. appl., v.v. 19, pp.933 - ? | - |
| dc.citation.title | Phys. appl. | - |
| dc.citation.volume | v. 19 | - |
| dc.citation.startPage | 933 | - |
| dc.citation.endPage | ? | - |
| dc.subject.keywordAuthor | transistors MOS | - |
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