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Issue Date
Title
Author(s)
1995-01
New concept for amorphous diffusion barrier: Ion beam modification of metal/semiconductor interface.
Kim Yong Tae
;
S. K. Kwak
;
C. S. Kwon
;
D. J. Kim
;
C. W. Lee
;
I. H. Choi
;
Min Suk-Ki
1993-01
Effects of nitrogen on the stress of plasma deposited tungsten and tungsten nitride thin films.
Kim Yong Tae
;
S. J. Lee
;
C. S. Kwon
;
Y. W. Park
;
C. C. Lee
;
C. W. Lee
;
Min Suk-Ki
1993-01
Atomic force microscopic observation in the surface morphologies and roughness of plasma deposited tungsten and tungsten nitride thin films.
Kim Yong Tae
;
C. S. Kwon
;
I. H. Choi
;
C. W. Lee
;
Min Suk-Ki
1994-01
Comparison of high temperature thermal stability of Ru and RuO//2 schottky contact to GaAs.
Kim Yong Tae
;
S. K. Kwak
;
C. W. Lee
;
J. G. Lee
;
C. S. Kwon
;
K. S. Jung
;
Min Suk-Ki
1993-01
Comparison of plasma deposited tungsten and tungsten nitride schottky contacts to GaAs.
Kim Yong Tae
;
S. J. Lee
;
C. S. Kwon
;
C. W. Lee
;
Min Suk-Ki
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C. S. Kwon
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1993
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