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dc.contributor.authorKim, Donghyeok-
dc.contributor.authorPark, Young Ran-
dc.contributor.authorKim, Chanhyeok-
dc.contributor.authorLee, Seungguan-
dc.contributor.authorMin, Hanul-
dc.contributor.authorWang, Gunuk-
dc.date.accessioned2024-09-05T08:30:06Z-
dc.date.available2024-09-05T08:30:06Z-
dc.date.created2024-09-05-
dc.date.issued2024-09-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/150545-
dc.description.abstractHalide perovskite materials have emerged as highly promising candidates for a wide range of electrical and optical devices due to their high charge carrier mobility, tunable band gaps, and facile manufacturability. However, their potential use as active channels in field-effect transistor (FET) memory devices remains underexplored, primarily due to challenges related to operational instability and the control of interfaces and crystallinity. Here, we present a significant advancement in perovskite field-effect transistor (PeFET) memory devices, utilizing large grain-sized alpha-phase formamidinium lead triiodide (FAPbI(3)). The alpha-phase FAPbI(3) was synthesized using a black powder method with MACl and MDACl(2) additives, resulting in enhanced crystallinity and a well-defined energy bandgap. Additionally, it demonstrated excellent stability to external environmental conditions, such as high humidity (>= 40 RH %) and thermal conditions (<= 150 degrees C). Using this method, the fabricated PeFET memory devices demonstrated anticlockwise p-type switching behavior with an I-ON/I-OFF ratio of 1.34 +/- 0.54 x 10(3) and durability over 100 continuous sweeping cycles under ambient conditions. We propose a switching mechanism that relies on the combined effects of mixed ionic-electronic conduction and charge trapping and detrapping at the interface between FAPbI(3) and SiO2.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.titlePerovskite Field-Effect Transistor Memory Employing a Large Grain Sized α-Phase Formamidinium Lead Triiodide-
dc.typeArticle-
dc.identifier.doi10.1021/acsaelm.4c01022-
dc.description.journalClass1-
dc.identifier.bibliographicCitationACS Applied Electronic Materials, v.6, no.9, pp.6561 - 6568-
dc.citation.titleACS Applied Electronic Materials-
dc.citation.volume6-
dc.citation.number9-
dc.citation.startPage6561-
dc.citation.endPage6568-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.scopusid2-s2.0-85202502186-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle; Early Access-
dc.subject.keywordPlusSOLAR-CELLS-
dc.subject.keywordPlusHIGH-PERFORMANCE-
dc.subject.keywordPlusION MIGRATION-
dc.subject.keywordPlusDEGRADATION-
dc.subject.keywordPlusEFFICIENT-
dc.subject.keywordAuthorhalide perovskite-
dc.subject.keywordAuthorFAPbI(3)-
dc.subject.keywordAuthorfield-effecttransistor memory-
dc.subject.keywordAuthormixed ionic-electronic conduction transport-
dc.subject.keywordAuthorcharge trapping/detrapping transport-
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