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dc.contributor.authorPrasetiyawati, Rahma Dhani-
dc.contributor.authorSong, Sehwan-
dc.contributor.authorKwon, Seyoung-
dc.contributor.authorChoi, Min-Yeong-
dc.contributor.authorChoi, Min Chul-
dc.contributor.authorLim, Woo Tack-
dc.contributor.authorPark, Tuson-
dc.contributor.authorJang, Jae Hyuck-
dc.contributor.authorPark, Sungkyun-
dc.contributor.authorPark, Se Young-
dc.contributor.authorLee, Suyoun-
dc.contributor.authorChoi, Woo Seok-
dc.date.accessioned2025-11-26T09:32:52Z-
dc.date.available2025-11-26T09:32:52Z-
dc.date.created2025-11-26-
dc.date.issued2025-11-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/153659-
dc.description.abstractMagnetic transport properties are essential for probing the interaction between charge and spin dynamics. Those include the anomalous Hall effect (AHE) and topological Hall effect (THE), which are useful in the development of spintronic devices. SrRuO3 (SRO) offers an ideal platform for investigating the Hall effect, induced by robust ferromagnetism, and can be further manipulated by tuning the spin-orbit-coupled band structure near the Fermi level. In this study, we investigated how Mo doping enhances Hall resistivity (rho xy ), along with the emergence and engineering of the hump anomaly in rho xy of epitaxial SRO thin films. The tunable hump anomaly was attributed to the multi-domain AHE model based on spatial inhomogeneities and k-space Berry curvature. Our results present the underlying mechanism of hump formation and provide a feasible approach for enhancing the AHE of SRO films to boost the controllability of spintronic devices.-
dc.languageEnglish-
dc.publisherAmerican Chemical Society-
dc.titleEngineering Hall Resistivity Anomalies in Epitaxial SrRuO3 Thin Films by Mo Doping-
dc.typeArticle-
dc.identifier.doi10.1021/acsami.5c14336-
dc.description.journalClass1-
dc.identifier.bibliographicCitationACS Applied Materials & Interfaces, v.17, no.46, pp.63540 - 63548-
dc.citation.titleACS Applied Materials & Interfaces-
dc.citation.volume17-
dc.citation.number46-
dc.citation.startPage63540-
dc.citation.endPage63548-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid001609339800001-
dc.identifier.scopusid2-s2.0-105022168259-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordAuthoranomalous Hall effect-
dc.subject.keywordAuthorstrontium ruthenate-
dc.subject.keywordAuthorstrontium molybdate-
dc.subject.keywordAuthorHall resistivity-
dc.subject.keywordAuthorelectrondoping-
dc.subject.keywordAuthorBerry curvature-
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