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dc.contributor.author안재평-
dc.contributor.author김혜령-
dc.contributor.author이현정-
dc.contributor.author김윤성-
dc.contributor.author황태훈-
dc.contributor.author최승호-
dc.contributor.author임가현-
dc.date.accessioned2026-03-13T21:30:37Z-
dc.date.available2026-03-13T21:30:37Z-
dc.date.issued2026-01-27-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/154421-
dc.title대기차폐형 전지셀 단면 인시추 분석장치 및 이를 이용한 인시추 분석방법-
dc.typePatent-
dc.date.registration2026-01-27-
dc.date.application2022-11-30-
dc.identifier.patentRegistrationNumber12537236-
dc.identifier.patentApplicationNumber18/072,066-
dc.publisher.countryUS-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > 2022
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