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Issue DateTitleAuthor(s)
-Measurement and analysis of visibility impairment during June, 1994 in Seoul.Moon Kil Choo (K.C); BAIK NAM JUN; KIM YONG PYO; LEE JONG HOON
-Laser system for alignment and testing of high quality opical cavities and mirrors.SON JUNG YOUNG; V. V. Azarova; V. N. Svirin
-Low temperature preparation of SiO2 films with low interface trap density using diffusion and CVD methodJEON BUP JU; Lim Tae Hoon; Oh In Hwan
-Main trends in design of on-line wear monitoring systems.Myshkin N. K.; Markova L. V.; Semenyuk M. S.; Kong Hosung
-Fabrication of basic SFQ logic circuit with high T//c superconductors.Kim Young Hwan; 강준희; Jong Min Lee; Chang-Hoon Kim; HAHN TAEK SANG; S. E. Choi; CHOI SANG SAM
-Evaluation of the genetic toxicity of synthetic chemicals (IV) - Chromosomal aberration assay with 11 compounds in chinese hamster lung cells in vitro.Ryu Jae Chun; Kwon Oh-Seung; K.R. Kim; H.J. Kim; M.H. Kim; J.Y. Youn
-Evaluation of the genetic toxicity of synthetic compounds (IV) - Bone marrow micronucleus assay of genetic toxicity with 11 compounds in mice.Ryu Jae Chun; Kwon Oh-Seung; K.R. Kim; H.J. Kim; M.H. Kim; J.Y. Youn
-Characteristics of silicon oxide films prepared by chemical vapor deposition and dry oxidation method using ECR plasma sources.JEON BUP JU; 허정수; 윤용수; 정일현; Oh In Hwan; Lim Tae Hoon
-Electrical characteristics of silicon oxide films prepared by chemical vapor deposition method using ECR plama sources.JEON BUP JU; 허정수; 윤용수; 정일현; Oh In Hwan; Lim Tae Hoon
-Preparation of silicon oxide films using electron cyclotron resonance oxygen plasma허정수; JEON BUP JU; 윤용수; 정일현; Oh In Hwan; Lim Tae Hoon
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