Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Geon-Hyeong Kang | - |
dc.contributor.author | Jung, Ki Chul | - |
dc.contributor.author | Kim, Jong bum | - |
dc.contributor.author | Kang, Joon Hyun | - |
dc.contributor.author | Kim, In Soo | - |
dc.contributor.author | Kim, Young-Hwan | - |
dc.date.accessioned | 2024-01-12T02:35:25Z | - |
dc.date.available | 2024-01-12T02:35:25Z | - |
dc.date.created | 2022-11-22 | - |
dc.date.issued | 2022-11 | - |
dc.identifier.issn | 2079-6412 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/75939 | - |
dc.description.abstract | In this study, we demonstrate the growth of high-quality KTa1-xNbxO3 (KTN) thin films by using multi-target radio frequency (RF) magnetron co-sputtering with KTaO3, KNbO3, and K2CO3 targets. KTaO3 and KNbO3 targets were used to control the Ta/Nb ratio while the K2CO3 target was used to supply excess potassium (K) to compensate for the K deficiency. Through careful control of the RF powers applied to each target, high-quality perovskite KTN (x = 0.53) thin films were grown on various single crystal substrates. Variable temperature Raman spectroscopy revealed that the KTN thin films exhibit a ferroelectric phase at room temperature with a Curie temperature of similar to 403 K. The optical constants n and k of the KTN thin film were also similar to those reported for single KTN crystals. These results present a simple route toward fabricating high-quality perovskite KTN thin films with desired structural and optical properties for various device applications utilizing the RF magnetron co-sputtering method. | - |
dc.language | English | - |
dc.publisher | MDPI AG | - |
dc.title | Growth of High-Quality Perovskite KTa1-xNbxO3 Thin Films by RF Magnetron Co-Sputtering | - |
dc.type | Article | - |
dc.identifier.doi | 10.3390/coatings12111787 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Coatings, v.12, no.11, pp.1787 | - |
dc.citation.title | Coatings | - |
dc.citation.volume | 12 | - |
dc.citation.number | 11 | - |
dc.citation.startPage | 1787 | - |
dc.description.isOpenAccess | Y | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000894883300001 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | PULSED-LASER DEPOSITION | - |
dc.subject.keywordPlus | REFRACTIVE-INDEX | - |
dc.subject.keywordPlus | CRYSTALLIZATION | - |
dc.subject.keywordPlus | BEHAVIOR | - |
dc.subject.keywordAuthor | ferroelectricity | - |
dc.subject.keywordAuthor | high-resolution X-ray diffraction | - |
dc.subject.keywordAuthor | potassium tantalate niobate | - |
dc.subject.keywordAuthor | RF magnetron co-sputtering | - |
dc.subject.keywordAuthor | Raman spectroscopy | - |
dc.subject.keywordAuthor | spectroscopic ellipsometry | - |
dc.subject.keywordAuthor | thin films | - |
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