KIST Library Institutional Repository

테라헤르츠 메타물질을 이용한 반도체 물질 극표면 광-전기적 특성 비접촉식 관찰 방법

Author

서민아; 김대식; 최근창

Assignee

한국과학기술연구원

Regitration Date

2020-04-01

Registration No.

10-2098284

Application Date

2018-03-22

Application No.

10-2018-0033366

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/76248

Appears in Collections:

KIST Patent > Others

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