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이차전지 음극재 SiOx의 APT를 이용한 나노구조 분석

Authors

LEE, JI YEONG; PARK, GI HOON; Yanghee, Kim; Jeong Young Woo; Ahn, Jae Pyoung; Hye Jung Chang

Issue Date

2021-10-14

Publisher

한국표면분석학회

Citation

2021년도 제15회 표면분석심포지엄

ISSN

-

URI

https://pubs.kist.re.kr/handle/201004/77326

Appears in Collections:

KIST Conference Paper > 2021

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