Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Minyoung Na | - |
| dc.contributor.author | 곽계영 | - |
| dc.contributor.author | 김태건 | - |
| dc.contributor.author | 김경중 | - |
| dc.contributor.author | Hye Jung Chang | - |
| dc.date.accessioned | 2024-01-12T03:44:55Z | - |
| dc.date.available | 2024-01-12T03:44:55Z | - |
| dc.date.created | 2021-12-14 | - |
| dc.date.issued | 2021-10 | - |
| dc.identifier.issn | - | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/77342 | - |
| dc.language | English | - |
| dc.publisher | 한국표면분석학회 | - |
| dc.title | Thickness measurement conditions for amorphous ultra-thin film using HAADF-STEM | - |
| dc.type | Conference | - |
| dc.description.journalClass | 2 | - |
| dc.identifier.bibliographicCitation | 2021년도 제15회 표면분석심포지엄 | - |
| dc.citation.title | 2021년도 제15회 표면분석심포지엄 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 서울 프레지던트 호텔 | - |
| dc.citation.conferenceDate | 2021-10-13 | - |
- Appears in Collections:
- KIST Conference Paper > 2021
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