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dc.contributor.authorHye Jung Chang-
dc.date.accessioned2024-01-12T03:45:12Z-
dc.date.available2024-01-12T03:45:12Z-
dc.date.created2021-12-14-
dc.date.issued2021-08-10-
dc.identifier.issn--
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/77357-
dc.description.abstractWe can infer electric or magnetic property changes by analyzing atomic structure or electric/magnetic domain structure. We can implement real-time measurement and observation simultaneously in TEM by controlling temperature, electric bias/current, magnetic field and etc. In this talk, our recent in-situ TEM works in electric/magnetic mateirlas will be introduced; atomic and electronic reconstruction at the ferroelectric oxide interface and skyrmion magnetic structure evolution.-
dc.languageEnglish-
dc.publisherAPCTP-
dc.titleIn-situ TEM system for electric/magnetic materials-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationThe 2nd International Workshop on Scanning Probe Microscopy, pp.23-
dc.citation.titleThe 2nd International Workshop on Scanning Probe Microscopy-
dc.citation.startPage23-
dc.citation.endPage23-
dc.citation.conferencePlaceKO-
dc.citation.conferencePlace제주-
dc.citation.conferenceDate2021-08-09-
dc.relation.isPartOfThe 2nd International Workshop on Scanning Probe Microscopy-
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KIST Conference Paper > 2021
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