Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hye Jung Chang | - |
dc.date.accessioned | 2024-01-12T03:45:12Z | - |
dc.date.available | 2024-01-12T03:45:12Z | - |
dc.date.created | 2021-12-14 | - |
dc.date.issued | 2021-08-10 | - |
dc.identifier.issn | - | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/77357 | - |
dc.description.abstract | We can infer electric or magnetic property changes by analyzing atomic structure or electric/magnetic domain structure. We can implement real-time measurement and observation simultaneously in TEM by controlling temperature, electric bias/current, magnetic field and etc. In this talk, our recent in-situ TEM works in electric/magnetic mateirlas will be introduced; atomic and electronic reconstruction at the ferroelectric oxide interface and skyrmion magnetic structure evolution. | - |
dc.language | English | - |
dc.publisher | APCTP | - |
dc.title | In-situ TEM system for electric/magnetic materials | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | The 2nd International Workshop on Scanning Probe Microscopy, pp.23 | - |
dc.citation.title | The 2nd International Workshop on Scanning Probe Microscopy | - |
dc.citation.startPage | 23 | - |
dc.citation.endPage | 23 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.conferencePlace | 제주 | - |
dc.citation.conferenceDate | 2021-08-09 | - |
dc.relation.isPartOf | The 2nd International Workshop on Scanning Probe Microscopy | - |
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