DSpace at KISTKIST Conference Paper2021

Full metadata record

DC Field Value Language
dc.contributor.authorZhai, Min-
dc.contributor.authorLocquet, A.-
dc.contributor.authorJung, Mi-
dc.contributor.authorWoo, Deokha-
dc.contributor.authorCitrin, D. S.-
dc.date.accessioned2024-01-12T04:08:43Z-
dc.date.available2024-01-12T04:08:43Z-
dc.date.created2022-05-27-
dc.date.issued2021-
dc.identifier.issn2162-2027-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/77785-
dc.description.abstractThe structure and morphology of nanoporous alumina (NP Al2O3) films on Al substrates are investigated by terahertz (THz) reflectometry and scattering imaging. One inhomogeneous area is identified in THz C-scan results off specular conditions at various angles. The thickness of NP Al2O3 films calculated based on THz results is in excellent agreement with destructive cross-sectional field emission scanning electron microscopy (FE-SEM) measurements.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleCharacterization of nanoporous alumina using terahertz reflectometry and scattering imaging-
dc.typeConference-
dc.identifier.doi10.1109/IRMMW-THz50926.2021.9567113-
dc.description.journalClass1-
dc.identifier.bibliographicCitation46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)-
dc.citation.title46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceELECTR NETWORK-
dc.citation.conferenceDate2021-08-30-
dc.relation.isPartOf2021 46TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ)-
dc.identifier.wosid000782468300260-
dc.identifier.scopusid2-s2.0-85125355066-
Appears in Collections:
KIST Conference Paper > 2021
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE