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Backside Illuminated, Three Dimensional Stacked Single Photon Avalanche Diode Technology in 45nm CMOS

Authors

Lee, Myung Jae

Issue Date

2018-09-25

Publisher

TGIST

Citation

Technical Group on Information Sensing Technologies

URI

https://pubs.kist.re.kr/handle/201004/79065

Appears in Collections:

KIST Conference Paper > 2018

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