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dc.contributor.authorPietryga, J.M.-
dc.contributor.authorBaea, W.K.-
dc.contributor.authorParka, Y.-S.-
dc.contributor.authorRobel, I.-
dc.contributor.authorKlimov, V.I.-
dc.date.accessioned2024-01-12T06:53:36Z-
dc.date.available2024-01-12T06:53:36Z-
dc.date.created2022-03-07-
dc.date.issued2015-05-
dc.identifier.issn1938-5862-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/80278-
dc.description.abstractDespite tremendous progress since the first demonstration of QDbased light-emitting diodes (QD-LEDs) there is substantial room for improvement in performance, particularly at high current densities. Here we analyze the role of Auger recombination in the performance of QD-LEDs by conducting a systematic characterization of device performance in conjunction with timeresolved spectroscopic studies of photoexcited carriers directly within the device structure. We use a series of structurally engineered core/shell QDs that exhibit very similar single-exciton properties, but distinctly different rates of non-radiative Auger recombination to show that both QD-LED efficiency and the onset for efficiency roll-off are strongly influenced by Auger recombination. Finally, we demonstrate that device efficiency can be improved by either reducing Auger recombination rates, or by improving charge-injection balance, both of which can be accomplished through engineering of the QD structure. ? 2014 by The Electrochemical Society.-
dc.languageEnglish-
dc.publisherElectrochemical Society Inc.-
dc.titleImproving the performance of quantum dot light-emitting diodes through nanoscale engineering-
dc.typeConference-
dc.identifier.doi10.1149/06105.0075ecst-
dc.description.journalClass1-
dc.identifier.bibliographicCitationInternational Symposium on Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 4 - 225th ECS Meeting, pp.75 - 85-
dc.citation.titleInternational Symposium on Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 4 - 225th ECS Meeting-
dc.citation.startPage75-
dc.citation.endPage85-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceOrlando, Florida-
dc.citation.conferenceDate2015-05-11-
dc.relation.isPartOfECS Transactions-
dc.identifier.scopusid2-s2.0-84925081666-
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