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dc.contributor.authorLim, Y.-A.-
dc.contributor.authorLee, C.G.-
dc.contributor.authorKim, J.-P.-
dc.contributor.authorRyu, J.-
dc.date.accessioned2024-01-12T07:23:59Z-
dc.date.available2024-01-12T07:23:59Z-
dc.date.created2022-03-07-
dc.date.issued2009-07-
dc.identifier.issn0000-0000-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/80947-
dc.description.abstractThis paper addresses stable haptic interaction for AFM(atomic force microscope)-based nanomanipulation. The EBA(energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a I-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors. ?2009 IEEE.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleStable haptic interaction for AFM-based nanomanipulation-
dc.typeConference-
dc.identifier.doi10.1109/ISIE.2009.5222558-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE International Symposium on Industrial Electronics, IEEE ISIE 2009, pp.983 - 988-
dc.citation.titleIEEE International Symposium on Industrial Electronics, IEEE ISIE 2009-
dc.citation.startPage983-
dc.citation.endPage988-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceSeoul-
dc.citation.conferenceDate2009-07-05-
dc.relation.isPartOfIEEE International Symposium on Industrial Electronics-
dc.identifier.scopusid2-s2.0-77950128207-
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KIST Conference Paper > 2009
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