Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lim, Y.-A. | - |
dc.contributor.author | Lee, C.G. | - |
dc.contributor.author | Kim, J.-P. | - |
dc.contributor.author | Ryu, J. | - |
dc.date.accessioned | 2024-01-12T07:23:59Z | - |
dc.date.available | 2024-01-12T07:23:59Z | - |
dc.date.created | 2022-03-07 | - |
dc.date.issued | 2009-07 | - |
dc.identifier.issn | 0000-0000 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/80947 | - |
dc.description.abstract | This paper addresses stable haptic interaction for AFM(atomic force microscope)-based nanomanipulation. The EBA(energy-bounding algorithm), a passivity-based haptic control algorithm, is modified to include the scaling factors in the scaled bilateral teleoperation, and a commercial AFM is revised to be used as a nanomanipulation system with a I-DOF custom-built haptic interface. Preliminary experiments show that the modified EBA can maintain stability during the interaction between an AFM probe and the surface of a sample for any force scaling factors. ?2009 IEEE. | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Stable haptic interaction for AFM-based nanomanipulation | - |
dc.type | Conference | - |
dc.identifier.doi | 10.1109/ISIE.2009.5222558 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | IEEE International Symposium on Industrial Electronics, IEEE ISIE 2009, pp.983 - 988 | - |
dc.citation.title | IEEE International Symposium on Industrial Electronics, IEEE ISIE 2009 | - |
dc.citation.startPage | 983 | - |
dc.citation.endPage | 988 | - |
dc.citation.conferencePlace | US | - |
dc.citation.conferencePlace | Seoul | - |
dc.citation.conferenceDate | 2009-07-05 | - |
dc.relation.isPartOf | IEEE International Symposium on Industrial Electronics | - |
dc.identifier.scopusid | 2-s2.0-77950128207 | - |
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