Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ahn, Jae Pyoung | - |
| dc.date.accessioned | 2024-01-12T07:25:57Z | - |
| dc.date.available | 2024-01-12T07:25:57Z | - |
| dc.date.created | 2022-01-14 | - |
| dc.date.issued | 2008-08 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/81039 | - |
| dc.language | English | - |
| dc.publisher | ICMAP | - |
| dc.title | Electrical properties and microstructural characterization of single ZnO nanowire sensor manufactured by focused ion beam | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | 2008 International Conference on Microelectronics and Plasma Technology | - |
| dc.citation.title | 2008 International Conference on Microelectronics and Plasma Technology | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | Ramada Plaza Jeju Hotel Jeju Island, Jeju, Korea | - |
| dc.citation.conferenceDate | 2008-08-18 | - |
| dc.relation.isPartOf | Electrical properties and microstructural characterization of single ZnO nanowire sensor manufacture | - |
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- KIST Conference Paper > 2008
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