Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | CHO, IL JOO | - |
| dc.date.accessioned | 2024-01-12T07:53:30Z | - |
| dc.date.available | 2024-01-12T07:53:30Z | - |
| dc.date.created | 2022-01-14 | - |
| dc.date.issued | 2007-06-15 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/81459 | - |
| dc.publisher | ISPM | - |
| dc.title | Thermal characterization of silicon nitride cantileverf for low power nano data storage application | - |
| dc.type | Conference | - |
| dc.description.journalClass | 2 | - |
| dc.identifier.bibliographicCitation | International Scanning Probe Microscopy Conference | - |
| dc.citation.title | International Scanning Probe Microscopy Conference | - |
| dc.citation.conferencePlace | KO | - |
| dc.relation.isPartOf | International Scanning Probe Microscopy Conference | - |
- Appears in Collections:
- KIST Conference Paper > 2007
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