Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Dong Ik | - |
| dc.date.accessioned | 2024-01-12T10:39:09Z | - |
| dc.date.available | 2024-01-12T10:39:09Z | - |
| dc.date.created | 2022-01-14 | - |
| dc.date.issued | 2000-01-01 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/84820 | - |
| dc.title | Texture analysis of fine wire with EBSD | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.relation.isPartOf | OIM academy, Utah, USA (2000) | - |
- Appears in Collections:
- KIST Conference Paper > 2000
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