Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeong, Jeung hyun | - |
| dc.date.accessioned | 2024-01-12T10:42:43Z | - |
| dc.date.available | 2024-01-12T10:42:43Z | - |
| dc.date.created | 2022-01-14 | - |
| dc.date.issued | 1999-01-01 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/84980 | - |
| dc.title | Analysis of reliability of thin-film materials for microelectronic components | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.relation.isPartOf | The Korea-U.S. Materials Symposium | - |
- Appears in Collections:
- KIST Conference Paper > Others
- Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
KIST 리포지터리는 국립중앙도서관 OAK 보급사업으로 구축되었습니다.