DSpace at KISTKIST Conference PaperOthers

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dc.contributor.authorJeong, Jeung hyun-
dc.date.accessioned2024-01-12T10:42:43Z-
dc.date.available2024-01-12T10:42:43Z-
dc.date.created2022-01-14-
dc.date.issued1999-01-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/84980-
dc.titleAnalysis of reliability of thin-film materials for microelectronic components-
dc.typeConference-
dc.description.journalClass1-
dc.relation.isPartOfThe Korea-U.S. Materials Symposium-
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