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전계흡수형　소자의　단면　반사율　측정방법

Author

이석; 한일기; 김회종; 박윤호; 강병권; 최원준; 변영태; 김선호; 우덕하

Assignee

한국과학기술연구원

Regitration Date

2003-01-08

Registration No.

368789

Application Date

2000-02-07

Application No.

00-5561

Country

KO

URI

https://pubs.kist.re.kr/handle/201004/85247

Appears in Collections:

KIST Patent > 2000

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