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dc.contributor.authorJung, Jae Hoon-
dc.contributor.authorJu, Byeong Kwon-
dc.contributor.authorKim, Hoon-
dc.contributor.authorOh, Myung Hwan-
dc.contributor.authorChung, Suk Jae-
dc.contributor.authorJang, Jin-
dc.date.accessioned2024-01-12T11:11:40Z-
dc.date.available2024-01-12T11:11:40Z-
dc.date.created2022-03-07-
dc.date.issued1997-08-
dc.identifier.issn0000-0000-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85500-
dc.description.abstractWe have studied on the enhancement of field emission characteristics by hydrogen-free N-doped diamond-like carbon (DLC) coating on Mo-tip field emitter arrays by a layer-by-layer technique using plasma enhanced chemical vapor deposition. The Spindt-type Molybdenum tip is used as a emission source without resistive layer on silicon substrate. The maximum emission current for each pixel was increased from 160 μA to 1520 μA by 20 nm N-doped DLC coating Furthermore, the emission current from DLC coated FEAs is more stable than that of non-coated FEAs.-
dc.languageEnglish-
dc.publisherIEEE-
dc.titleEffect of N doping on the electron emission properties of DLC film on 2-inch Mo FEAs panel-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation1997 10th International Vacuum Microelectronics Conference, IVMC'97, pp.276 - 280-
dc.citation.title1997 10th International Vacuum Microelectronics Conference, IVMC'97-
dc.citation.startPage276-
dc.citation.endPage280-
dc.citation.conferencePlaceUS-
dc.citation.conferencePlaceKyongju-
dc.citation.conferenceDate1997-08-17-
dc.relation.isPartOfProceedings of the IEEE International Vacuum Microelectronics Conference, IVMC-
dc.identifier.scopusid2-s2.0-0031339347-
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