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Characteristics of SrBi2O2O9/thin oxide /Si structure for non-destructive read out

Authors

Kim, Yong Tae

Issue Date

1997-07-01

Citation

9th Int. Meeting on Ferroelectricity, pp.0

URI

https://pubs.kist.re.kr/handle/201004/85515

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KIST Conference Paper > Others

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