DSpace at KISTKIST Patent2019

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dc.contributor.author민병권-
dc.contributor.author전명석-
dc.date.accessioned2024-01-12T11:32:29Z-
dc.date.available2024-01-12T11:32:29Z-
dc.date.issued2021-08-31-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85668-
dc.title채널 벽면에 그래프팅된 전해질고분자 브러쉬층의 하전 특성 평가 방법 및 장치-
dc.typePatent-
dc.date.registration2021-08-31-
dc.date.application2019-11-29-
dc.identifier.patentRegistrationNumber10-2298422-
dc.identifier.patentApplicationNumber10-2019-0156582-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2019
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