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dc.contributor.authorDae-Young Jeon-
dc.contributor.authorS. J. Park-
dc.contributor.authorM. Mouis-
dc.contributor.authorS. Barraud-
dc.contributor.authorG. -T. Kim-
dc.contributor.authorG. Ghibaudo-
dc.date.accessioned2024-01-12T12:43:33Z-
dc.date.available2024-01-12T12:43:33Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/87271-
dc.languageEnglish-
dc.publisher2.5~7, 하이원리조트-
dc.subjectseries resistance-
dc.subjectnull-
dc.subjectjunctionless transistors-
dc.subjectnull-
dc.subjectbulk conduction-
dc.subjectnull-
dc.subjectaccumulation conduction-
dc.titleSeries resistance characterization of junctionless transistors-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation한국반도체학술대회-
dc.citation.title한국반도체학술대회-
dc.citation.conferencePlaceKO-
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