랩온어칩에서의 형광 편광 측정 방법

Author
양은경김정환김태송조한상강지윤신현준주병권
Assignee
한국과학기술연구원
Regitration Date
2008-04-10
Registration No.
10-0822810-00-00
Application Date
2005-11-23
Application No.
2005-0112165
Country
KO
URI
https://pubs.kist.re.kr/handle/201004/87455
Appears in Collections:
KIST Patent > 2005
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