Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 정경윤 | - |
dc.contributor.author | 김동현 | - |
dc.contributor.author | 디키 수산토 | - |
dc.contributor.author | 장원영 | - |
dc.contributor.author | 조병원 | - |
dc.contributor.author | 오시형 | - |
dc.contributor.author | 윤여조 | - |
dc.date.accessioned | 2024-01-12T14:31:57Z | - |
dc.date.available | 2024-01-12T14:31:57Z | - |
dc.date.issued | 2018-10-30 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/89148 | - |
dc.title | 투과형 엑스선 회절 분석장치용 퍼니스 및 이를 이용한 투과형 엑스선 회절 분석장치 | - |
dc.type | Patent | - |
dc.date.registration | 2018-10-30 | - |
dc.date.application | 2016-04-15 | - |
dc.identifier.patentRegistrationNumber | 10113980 | - |
dc.identifier.patentApplicationNumber | 15/099678 | - |
dc.publisher.country | US | - |
dc.type.iprs | 특허 | - |
dc.contributor.assignee | 한국과학기술연구원 | - |
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