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dc.contributor.authorPark Se Jin-
dc.contributor.authorKim, Haeri-
dc.contributor.authorMin Byoung Koun-
dc.date.accessioned2024-01-12T15:34:18Z-
dc.date.available2024-01-12T15:34:18Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/90434-
dc.languageEnglish-
dc.subjectCIGSSe-
dc.subjectKPFM-
dc.subjectSPV-
dc.subjectSolution process-
dc.titleDefect Analysis of Solution Processed CIGSSe Thin Films with Different S/Se Distribution Based on Surface Photovoltage Using KPFM-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation18th International Conference on non contact Atomic Force Microscopy-
dc.citation.title18th International Conference on non contact Atomic Force Microscopy-
dc.citation.conferencePlaceFR-
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