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Defect Analysis of Solution Processed CIGSSe Thin Films with Different S/Se Distribution Based on Surface Photovoltage Using KPFM

Authors

Park Se Jin; Kim, Haeri; Min Byoung Koun

Citation

18th International Conference on non contact Atomic Force Microscopy

Keywords

CIGSSe; KPFM; SPV; Solution process

URI

https://pubs.kist.re.kr/handle/201004/90434

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KIST Conference Paper > Others

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