Calibration of specimen temperature and specimen displacement based on In-situ x-ray diffraction measurements using soller slits optic

Authors
LEE YUNJUYang Bum JinJung Il DooWon, Sung Ok
Publisher
제53회 한국분석과학회 추계학술대회
Citation
한국분석과학회, pp.148
Keywords
In-situ; XRD; High temperature; HT-XRD; lattice parameters
URI
https://pubs.kist.re.kr/handle/201004/91162
Appears in Collections:
KIST Conference Paper > Others
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