Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김선희 | - |
| dc.contributor.author | Jang Yun Jung | - |
| dc.contributor.author | 윤정현 | - |
| dc.contributor.author | Jeung-hyun Jeong | - |
| dc.contributor.author | LEE, YEON HEE | - |
| dc.date.accessioned | 2024-01-12T18:04:01Z | - |
| dc.date.available | 2024-01-12T18:04:01Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/93275 | - |
| dc.language | English | - |
| dc.title | Comparison of Quantitative Analysis for CIGS Thin Films by TOFSIMS, Magnetic Sector SIMS, and AES | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | International Conference on Secondary Ion Mass Spectrometry | - |
| dc.citation.title | International Conference on Secondary Ion Mass Spectrometry | - |
| dc.citation.conferencePlace | KO | - |
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