DSpace at KISTKIST Conference PaperOthers

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dc.contributor.authorLEE, YEON HEE-
dc.contributor.authorLee Ji-hye-
dc.contributor.author김선희-
dc.contributor.authorKang Minhwa-
dc.date.accessioned2024-01-12T18:04:05Z-
dc.date.available2024-01-12T18:04:05Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/93281-
dc.languageEnglish-
dc.titleSurface Analysis and Depth Profiling of Polymers by TOF-SIMS-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationThe 15th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions-
dc.citation.titleThe 15th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions-
dc.citation.conferencePlaceJA-
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