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dc.contributor.authorAnkush Vij-
dc.contributor.authorAmanpal Singh-
dc.contributor.authorRavi Kumar-
dc.contributor.authorSanjeev Gautam-
dc.contributor.authorDinesh Kumar-
dc.contributor.authorCHAE, KEUN HWA-
dc.date.accessioned2024-01-12T18:34:39Z-
dc.date.available2024-01-12T18:34:39Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/93875-
dc.languageEnglish-
dc.subjectSol-gel-
dc.subjectX-ray diffraction-
dc.subjectX-ray absorption spectroscopy-
dc.titleNear edge X-ray absorption fine structure study of Zn0.8Mg0.2O thin films-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationAIP conference proceedings, v.1536, pp.721 - 722-
dc.citation.titleAIP conference proceedings-
dc.citation.volume1536-
dc.citation.startPage721-
dc.citation.endPage722-
dc.citation.conferencePlaceUS-
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