DSpace at KISTKIST Patent2017

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dc.contributor.author김세윤-
dc.contributor.author정지현-
dc.contributor.author조재형-
dc.date.accessioned2024-01-12T19:32:23Z-
dc.date.available2024-01-12T19:32:23Z-
dc.date.issued2019-05-28-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/94842-
dc.title개방단말 동축선 프로브를 사용하여 측정된 매질 전기적 특성의 정확도 평가 및 개선 방법-
dc.typePatent-
dc.date.registration2019-05-28-
dc.date.application2017-09-27-
dc.identifier.patentRegistrationNumber10-1985459-
dc.identifier.patentApplicationNumber2017-0125306-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2017
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