Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김선희 | - |
| dc.contributor.author | Lee Ji-hye | - |
| dc.contributor.author | LIM, WEON CHEOL | - |
| dc.contributor.author | LEE, YEON HEE | - |
| dc.date.accessioned | 2024-01-12T21:34:36Z | - |
| dc.date.available | 2024-01-12T21:34:36Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/97241 | - |
| dc.language | English | - |
| dc.subject | TOF-SIMS | - |
| dc.subject | imaging | - |
| dc.subject | identification | - |
| dc.subject | signatures | - |
| dc.title | Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging | - |
| dc.type | Conference | - |
| dc.description.journalClass | 2 | - |
| dc.identifier.bibliographicCitation | 표면분석심포지움 | - |
| dc.citation.title | 표면분석심포지움 | - |
| dc.citation.conferencePlace | KO | - |
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