Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee Ji-hye | - |
dc.contributor.author | A. Ceglia | - |
dc.contributor.author | 김강진 | - |
dc.contributor.author | LEE, YEON HEE | - |
dc.date.accessioned | 2024-01-12T22:05:42Z | - |
dc.date.available | 2024-01-12T22:05:42Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/97888 | - |
dc.language | English | - |
dc.subject | SIMS | - |
dc.subject | TOF | - |
dc.subject | PCA | - |
dc.subject | dye | - |
dc.title | Characterization of dyed textiles using TOF-SIMS with PCA | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | 8th international symposium on atomic level charaterizations for new materials and devices'11, pp.177 - 179 | - |
dc.citation.title | 8th international symposium on atomic level charaterizations for new materials and devices'11 | - |
dc.citation.startPage | 177 | - |
dc.citation.endPage | 179 | - |
dc.citation.conferencePlace | KO | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.