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Characterization of dyed textiles using TOF-SIMS with PCA

Authors

Lee Ji-hye; A. Ceglia; 김강진; LEE, YEON HEE

Citation

8th international symposium on atomic level charaterizations for new materials and devices'11, pp.177 - 179

Keywords

SIMS; TOF; PCA; dye

URI

https://pubs.kist.re.kr/handle/201004/97888

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KIST Conference Paper > Others

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