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dc.contributor.authorHong Seung Hee-
dc.contributor.authorHeung Nam Han-
dc.contributor.authorPhaniraj Madakashira-
dc.contributor.authorKim, Dong-Ik-
dc.contributor.authorAhn, Jae Pyoung-
dc.contributor.authorCho, Young Whan-
dc.date.accessioned2024-01-12T22:07:26Z-
dc.date.available2024-01-12T22:07:26Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/98014-
dc.languageEnglish-
dc.subjectSOFC-
dc.subjectInterconnect-
dc.subjectEBSD-
dc.subjectTEM-
dc.subjectoxidation-
dc.titleMicrostructural analysis of oxide layer formation of ferritic stainless steel interconnect-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationMicroscopy of oxidation 8-
dc.citation.titleMicroscopy of oxidation 8-
dc.citation.conferencePlaceUK-

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