Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hong Seung Hee | - |
dc.contributor.author | Heung Nam Han | - |
dc.contributor.author | Phaniraj Madakashira | - |
dc.contributor.author | Kim, Dong-Ik | - |
dc.contributor.author | Ahn, Jae Pyoung | - |
dc.contributor.author | Cho, Young Whan | - |
dc.date.accessioned | 2024-01-12T22:07:26Z | - |
dc.date.available | 2024-01-12T22:07:26Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/98014 | - |
dc.language | English | - |
dc.subject | SOFC | - |
dc.subject | Interconnect | - |
dc.subject | EBSD | - |
dc.subject | TEM | - |
dc.subject | oxidation | - |
dc.title | Microstructural analysis of oxide layer formation of ferritic stainless steel interconnect | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | Microscopy of oxidation 8 | - |
dc.citation.title | Microscopy of oxidation 8 | - |
dc.citation.conferencePlace | UK | - |
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