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dc.contributor.authorP.P. Choi-
dc.contributor.authorI. Povstugar-
dc.contributor.authorAhn, Jae Pyoung-
dc.contributor.authorA. Kostka-
dc.contributor.authorD. Raabe-
dc.date.accessioned2024-01-12T22:35:58Z-
dc.date.available2024-01-12T22:35:58Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/98457-
dc.languageEnglish-
dc.subjectHard coating-
dc.subjectatom probe microscopy-
dc.subjectmultilayer-
dc.subjectthermal stability-
dc.subjectatom probe tomography-
dc.titleThermal stability of TiAlN/CrN multilayer coatings studied by Atom Probe Tomography-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIFES 2010-
dc.citation.titleIFES 2010-
dc.citation.conferencePlaceAT-
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