DSpace at KISTKIST Conference PaperOthers

Full metadata record

DC Field Value Language
dc.contributor.authorJun-Woo Park-
dc.contributor.authorHosun Lee-
dc.contributor.authorTae Dong Kang-
dc.contributor.authorAndrei Sirenko-
dc.contributor.authorLee Hyun Seok-
dc.contributor.authorLee Suyoun-
dc.contributor.authorJeung-hyun Jeong-
dc.contributor.authorCHEONG, BYUNG KI-
dc.date.accessioned2024-01-12T23:06:26Z-
dc.date.available2024-01-12T23:06:26Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/99069-
dc.languageEnglish-
dc.titleSpectroscopic Ellipsometry and Raman Spectroscopy of Ge-doped SbTe Thin Films-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationMaterial Research Society-
dc.citation.titleMaterial Research Society-
dc.citation.conferencePlaceUS-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE