DSpace at KISTKIST Patent2000

Full metadata record

DC Field Value Language
dc.contributor.author안효석-
dc.contributor.authorOIEG Y. KOMKOV-
dc.contributor.author김충현-
dc.contributor.authorSERGEI A.CHIZHI-
dc.contributor.authorANDREI M. DUBRA-
dc.date.accessioned2024-01-12T23:33:53Z-
dc.date.available2024-01-12T23:33:53Z-
dc.date.issued2002-08-27-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/99472-
dc.titleSCANNING PROBE MICROSCOPE-
dc.typePatent-
dc.date.registration2002-08-27-
dc.date.application2000-04-03-
dc.identifier.patentRegistrationNumber6,441,371-
dc.identifier.patentApplicationNumber09/541,623-
dc.publisher.countryUS-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > 2000
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE