Investigation of Microphase Separation of PS-PPrMA Diblock Copolymer Films by Time-of-Flight Secondary Ion Mass Spectrometry

Authors
LEE, YEON HEELee Ji-hyeLIM, WEON CHEOL신관우
Citation
5th International Symposium on Practical Surface Analysis, pp.97
Keywords
microphase; separation; PS-PPrMA; diblock; copolymer; ToF; SIMS
URI
https://pubs.kist.re.kr/handle/201004/99552
Appears in Collections:
KIST Conference Paper > Others
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