Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | LIM, WEON CHEOL | - |
dc.contributor.author | Lee Ji-hye | - |
dc.contributor.author | LEE, YEON HEE | - |
dc.date.accessioned | 2024-01-12T23:35:15Z | - |
dc.date.available | 2024-01-12T23:35:15Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/99555 | - |
dc.language | English | - |
dc.subject | CIGS | - |
dc.subject | solar | - |
dc.subject | quantitative | - |
dc.subject | depth profile | - |
dc.subject | dynamic SIMS | - |
dc.title | Characterization of Cu(InGa)Se2 (CIGS) thin films in solar cell devices by secondary ion mass spectrometry | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | 5th International Symposium on Practical Surface Analysis, pp.203 | - |
dc.citation.title | 5th International Symposium on Practical Surface Analysis | - |
dc.citation.startPage | 203 | - |
dc.citation.endPage | 203 | - |
dc.citation.conferencePlace | JA | - |
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